Nanocrystal
Characterisation
A suite of advanced analytical techniques that reveal both structural and morphological properties supports our research. X-ray diffraction (XRD) is routinely employed to determine crystal structure and phase purity, providing foundational insight into the crystallographic identity of nanomaterials.
Complementary to XRD, high-resolution transmission electron microscopy (TEM) enables direct atomic-scale imaging of nanocrystals, capturing details of particle shape, size distribution, and lattice fringes. Bernal Institute hosts world-class TEM facilities, as well as analytical attachments, such as energy-dispersive X-ray spectroscopy for compositional analysis.